Our scientific background and main research areas include:
The Mobius project
- complexity theory based security;
- zero-knowledge protocols;
- unconditional security;
- formal software construction:
- functional programming;
- software specification;
- software verification with model checking and with computer-assisted provers;
- compiler construction;
- algorithms and complexity.
TLS Technologies participates in the Integrated European Project MOBIUS
launched under the FET Global Computing Proactive Initiative.
Its aim is to develop the technology for establishing trust and security for the next generation of global computers, using the Proof Carrying Code (PCC) paradigm. This paradigm allows automatic detection of security flaws and potential attacks on developed code.
The project involves 16 European participants, including two from Poland: Warsaw University and TLS Technologies.
Apart from the research conducted by TLS Technologies as a company, our team members carry or have carried out scientific research in the fields of:
- software specification and verification, in particular Java software verification with the Coq proof assistant;
- designing fault-tolerant distributed algorithms for systems prone to link and processor failures;
- investigating X-ray emission from accretion disks around stellar-mass and supermassive black holes.
- Support for XML in Java 5.0
Software Developers Journal, 2005;
GRS 1915+105: the brightest Galactic black hole
Chris Done, Grzegorz Wardziński, Marek Gierliński
- Alternatywne Ľródła zdarzeń SAX (in Polish)
Software 2.0, 2004;
- XML Schema - i co dalej? (in Polish)
Software 2.0, 2003;
CPU patch for Linux kernel
X-ray and gamma-ray spectra and variability of the black-hole candidate GX 339-4
Grzegorz Wardzinski, Andrzej A. Zdziarski, Marek Gierlinski, J. Eric Grove, Keith Jahoda, W. Neil Johnson
JAVA czy .NET?
Zaawansowane narzędzia programowania rozproszonego
Quantum Computing and Cryptography
Jako¶ć w Open Source
Thermal synchrotron radiation and its Comptonization in compact X-ray sources
Grzegorz Wardziński, Andrzej Zdziarski